Diamond 技术研讨会

探讨系统多芯片 (SoC) 测试面临挑战之解决方案

Solving SoC Test Challenges

 

因应系统多芯片面临之测试挑战及价格压力,提供高科技产业最佳解决方案的蔚华,与全球知名自动化测试设备供货商 Credence Systems Corporation ,将于五月二十三日上海博雅酒店举办「 Diamond 技术研讨会」,主题涵盖消费性市场趋势、 Diamond 所提供之价值方案、以及降低测试成本与方法之实例展示,此次的研讨会将是您不可错失之学习机会。

 

•  日期 : 5/23/2008 (Friday)

•  時間 : 09:00 – 16:00

•  地點 : 博雅酒店 一楼 宴会厅  (上海市浦东新区张江高科技园区碧波路699号)

•  費用 : 免费 ( 敬备午餐及茶点 )

•  报名方式 : 请于 5 月 14 日前填妥报名表 , 以 e-mail 或传真报名

•  洽询专线 : +86-21- 61081858 分机 2009 李晶 小姐 (Judy Lee)

•  E-mail: judy_lee@spirox.com.tw

•  传真专线 : 86-21- 50804105

 

活动议程

Time

Subjects

Description

0900-0930

Registration

0930-0945

Opening Remarks

0945-1015

Consumer Market Trends

What are the major trends in the consumer device market today? What are the inflection points that influence the devices we will be testing tomorrow? These and other questions will be answered in this overview of the consumer IC market.

1015-1045

Diamond: The Value Standard

There are key elements that enable a tester to have excellent throughput, low operating cost, and good technical coverage. These architectural elements will be discussed, as well as the design techniques in hardware and software that allow for fast program development and time-to-market.

1045-1100

Break

1100-1200

Instrument Requirements for Efficient Test

With the right hardware and software tools, a test engineer can be more productive and produce better quality tests for the products he supports. This presentation will look at some of the requirements and features that make a test engineer more efficient.

1200-1300

Lunch

1300-1350

Software Tools for Success

Translators, program generators, development and debug tools are all vitally important to a test engineer. We will look at a few of the software tools available and show how they can make the test engineer more efficient.

1350-1400

Break

1400-1500

Lowering Cost: Case Studies

The consumer IC market is very competitive, and cost will often determine who wins and who loses. In this presentation we use actual case studies to show how existing test methodology can be changed to drastically reduce test times and test cost. In addition, it is shown how the changes relate directly to the profit margin of the products tested.

1500-1510

Break

1510-1540

Live Demos

Live demos will be given on the Diamond 10 tester to illustrate some of the key features discussed during the presentations.

1540-1600

Closing Remarks / Questionaire / Lucky Draw

 

 

 

交通信息


博雅酒店 上海市浦东新区张江高科技园区碧波路 699 号 Tel:86-21-61621168